Tosca 400 AFM has the highest resolution and the fastest scanning. It has fast cantilever, probemaster tool, exchangeable actuator body, automatic laser alignment, coarse approach with side view camera and automatic engagement. In addition, it produces an image of the surface topography of a flat, solid sample, and measures physical and mechanical properties such as adhesion, frictional force, hardness, etc.
Available modes | Contact, tapping, lateral force microscopy, force distance curve, contact resonance amplitude imaging |
X-Y-Z scan range | 100 µm x 100 µm x 15 µm |
Maximum sample diameter, height | 100 mm, 25 mm |
Location | Loyola Campus (NDG) |
Room Number | HU – 230.19 |
Status | Available |